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Time-dependent water vapor permeation through multilayer barrier films: Empirical versus theoretical results

机译:时间相关的水蒸气透过多层阻隔膜的渗透:经验与理论结果

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Multilayer films that comprise alternating inorganic barrier and polymer layers deposited on a flexible substrate are often used to protect organic electronic devices from degradation caused by oxygen and water vapor. We tested films consisting of up to 11 inorganic silicon oxide barrier and polymer layers to characterize the water vapor permeability, solubility and diffusivity of each layer based on measurements of water sorption, transient water vapor permeation and lag times. The time-dependency of transient water vapor transmission rates (WVTR) of the structures containing a barrier-polymer-barrier sequence was also estimated using a so-called quasisteady-state (QSS) approximation. The permeability values and lag times in multilayer structures predicted by QSS approximation agreed with the values determined empirically based on time-dependent WVTR measurements. The steady-state WVTR of the multilayer barrier films was dominated by the permeability of the inorganic barrier layers, whereas the solubility coefficient and thickness of the interleaved polymer layers determined the lag times. The barrier performance and lag time of multilayer structures can be predicted using the parameters obtained from sorption measurements, thus significantly reducing the time required for experiments. The results of this study will allow us to design multilayer barrier films according to the lifetime requirements of flexible organic electronic devices.
机译:包含交替的无机阻挡层和沉积在柔性基板上的聚合物层的多层膜通常用于保护有机电子设备免受由氧气和水蒸气引起的降解。我们测试了由多达11个无机氧化硅阻隔层和聚合物层组成的薄膜,以基于对水的吸收,瞬态水蒸气渗透和滞后时间的测量来表征各层的水蒸气渗透性,溶解度和扩散性。还使用所谓的准稳态(QSS)近似估计了包含阻隔聚合物-阻隔序列的结构的瞬态水蒸气透过率(WVTR)的时间依赖性。通过QSS近似预测的多层结构的渗透率值和滞后时间与基于时间的WVTR测量经验确定的值一致。多层阻挡膜的稳态WVTR受无机阻挡层的渗透性支配,而溶解系数和交错聚合物层的厚度决定了滞后时间。可以使用从吸附测量获得的参数来预测多层结构的阻隔性能和滞后时间,从而大大减少了实验所需的时间。这项研究的结果将使我们能够根据柔性有机电子设备的使用寿命要求设计多层阻隔膜。

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