FORMATION AND ANALYSIS OF EXTENDED ELECTRON BEAMS IN VACUUM MICROWAVE DEVICES

摘要

General principles of formation of electron beams in static electric and magnetic fields are described in this paper. Both traditional and new promising trends of development of optical electron and magnetic systems are investigated. The issues of focusing and transmitting of beams of charged particles are analyzed from the point of view of present-day technologies and theoretical and experimental techniques for investigation of their parameters are considered.