Reflectance difference spectroscopy study of Ag growth on W(110)

摘要

We report a reflectance difference spectroscopy (RDS) investigation of the epitaxial growth of Ag on the W(110) surface. Monitoring the growth in real time, the RDS signal at 4.6 eV shows an oscillatory behavior corresponding to the layer-by-layer growth of the first three monolayers. The oscillations are attributed to the variation of the optical anisotropy contributed by the W(110) substrate and the Ag film. By analyzing the spectral evolution during growth, characteristic optical-electronic fingerprints can be deduced for each added atomic layer. In particular, the binding energy of d-like quantum well states has been used as an indicator for the number of Ag atomic layers and, hence, as a sensitive probe of the Ag thin film growth. (c) 2006 Elsevier B.V. All rights reserved.