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首页> 外文期刊>Surface Science >Vapor phase formation of a well-ordered aldehyde-terminated self-assembled monolayer on a SiO2 surface and formation of silver film on the surface based on the silver mirror reaction
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Vapor phase formation of a well-ordered aldehyde-terminated self-assembled monolayer on a SiO2 surface and formation of silver film on the surface based on the silver mirror reaction

机译:基于银镜反应,在SiO2表面上形成有序的醛基自组装单分子层的气相形成,并在表面上形成银膜

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A well-ordered aldehyde (CHO)-terminated self-assembled monolayer (SAM) was formed from a vapor of triethoxysilylundecanal (TESUD) onto both quartz glass plates and silicon substrates covered with native oxide. This vapor phase treatment produced a TESUD-SAM on both substrates without any marked change in surface morphology, as evidenced by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). The thickness of this SAM was estimated by ellipsometry to be 1.2 +/- 0.1 nm. Silver (Ag) metallization was also demonstrated on TESUD-SAM-covered quartz glass substrates based on the silver mirror reaction using an ammoniacal silver nitrate solution. XPS and AFM images confirmed that the deposited film was composed of densely packed Ag nanoparticles with an average diameter of 300 nm. The average thickness of the film was about 1-2 mu m. Due to this particulate Ag film formation, the transparent insulating quartz glass plate became conductive with a mirror-like surface. The CHO terminal groups of the TESUD-SAM were found to serve effectively as a reducing agent to deposit Ag metal at the solid/liquid interface. (c) 2006 Elsevier B.V. All rights reserved.
机译:由三乙氧基甲硅烷基苯二酚(TESUD)的蒸气在石英玻璃板和覆盖有天然氧化物的硅基板上形成有序的醛(CHO)端接的自组装单层(SAM)。 X射线光电子能谱(XPS)和原子力显微镜(AFM)证明,这种气相处理在两种基材上均产生TESUD-SAM,表面形态无明显变化。通过椭偏法将该SAM的厚度估计为1.2 +/- 0.1nm。基于氨镜硝酸银溶液的银镜反应,还证明了银(Ag)的金属化在TESUD-SAM覆盖的石英玻璃基板上。 XPS和AFM图像证实,沉积膜由紧密堆积的Ag纳米颗粒组成,平均直径为300 nm。膜的平均厚度为约1-2μm。由于这种颗粒状Ag膜的形成,透明绝缘石英玻璃板变得具有镜面状的导电性。发现TESUD-SAM的CHO末端基团有效地用作还原剂,以将Ag金属沉积在固/液界面上。 (c)2006 Elsevier B.V.保留所有权利。

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