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Atomic O and H exposure of C-covered and oxidized d-metal surfaces

机译:C覆盖和氧化的d金属表面的原子O和H暴露

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摘要

Carbon coverage, oxidation and reduction of Au, Pt, Pd, Rh, Cu, Ru, Ni and Co layers of 1.5 nm thickness on Mo have been characterized with ARPES and desorption spectroscopy upon exposure to thermal H and O radicals. We observe that only part of the carbon species is chemically eroded by atomic H exposure, yielding hydrocarbon desorption. Exposure to atomic O yields complete carbon erosion and CO_2 and H_2O desorption. A dramatic increase in metallic and non-metallic oxide is observed for especially Ni and Co surfaces, while for Au and Cu, the sub-surface Mo layer is much more oxidized. Although volatile oxides exist for some of the d-metals, there is no indication of d-metal erosion. Subsequent atomic H exposure reduces the clean oxides to a metallic state under desorption of H_2O. Due to its adequacy, we propose the atomic oxygen and subsequent atomic hydrogen sequence as a candidate for contamination removal in practical applications like photolithography at 13.5 nm radiation.
机译:通过ARPES和脱附光谱法,在暴露于热的H和O自由基后,可以表征Mo上1.5 nm厚度的Au,Pt,Pd,Pd,Rh,Cu,Ru,Ni和Co层的碳覆盖,氧化和还原。我们观察到,只有部分碳物质被原子H暴露化学腐蚀,从而产生碳氢化合物解吸。暴露于原子O会完全腐蚀碳,并使CO_2和H_2O解吸。尤其对于Ni和Co表面,观察到金属和非金属氧化物的急剧增加,而对于Au和Cu,次表面Mo层被氧化得多。尽管某些d-金属存在挥发性氧化物,但没有d-金属腐蚀的迹象。随后的原子H暴露在H_2O解吸下将清洁的氧化物还原为金属态。由于其适当性,我们提出了原子氧和随后的原子氢序列作为在实际应用中(例如在13.5 nm辐射下的光刻)去除污染物的候选方法。

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  • 来源
    《Surface Science》 |2009年第16期|2594-2599|共6页
  • 作者单位

    FOM Institute for Plasma Physics Rijnhuizen, Nieuwegein, The Netherlands;

    FOM Institute for Plasma Physics Rijnhuizen, Nieuwegein, The Netherlands;

    FOM Institute for Plasma Physics Rijnhuizen, Nieuwegein, The Netherlands;

    FOM Institute for Plasma Physics Rijnhuizen, Nieuwegein, The Netherlands MESA+ Institute for Nanofabrication, University Twente, Enschede, The Netherlands;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    d-Metals; chemical erosion; oxidation; reduction; ARPES; multilayers;

    机译:d-金属;化学腐蚀氧化减少;ARPES;多层;

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