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80 ns/45 GHz Pulsed measurement system for DC and RF characterization of high speed microwave devices

机译:80 ns / 45 GHz脉冲测量系统,用于高速微波设备的DC和RF表征

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摘要

This paper presents a combined pulsed 1(V)-pulsed RF state-of-the-art measurement system. Isothermal DC and AC measurement data can be achieved allowing a complete characterization and exploration of the safe operating area (SOA) of advanced SiGe:C HBTs. System behavior is explained in detail and reproduced by simulation taking into account the influence of all parasitic components. Optimization steps, system verification, measurement results and accuracy issues are presented.
机译:本文介绍了一种组合式脉冲1(V)脉冲RF最先进的测量系统。可以获得等温的直流和交流测量数据,从而可以对高级SiGe:C HBT的安全工作区域(SOA)进行完整的表征和探索。考虑到所有寄生元件的影响,将详细说明系统行为并通过仿真重现。介绍了优化步骤,系统验证,测量结果和准确性问题。

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