首页> 外文期刊>Solid State Communications >A quantitative understanding of pressure dependent conductivity of FeSi1-Ge-x(x)
【24h】

A quantitative understanding of pressure dependent conductivity of FeSi1-Ge-x(x)

机译:定量了解FeSi1-Ge-x(x)的压力依赖性电导率

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

A new density of states model, referred to as the Gaussian density of states, is proposed for the quantitative understanding of the electrical conductivity behaviour of FeSi Kondo insulating system. The effects of electron correlation and disorder, responsible for the physical properties of this system, are judiciously incorporated in this model. Within the framework of this model, a detailed quantitative analysis of the temperature and pressure dependent electrical conductivity data of FeSi1-xGex (x = 0.0: 0.05 and 0.20) reported by Awadhesh Mani et al. [Phys. Rev. B 63 (2001) 115103] has been carried out. From these analyses the complicated pressure dependence of energy gap seen experimentally in these samples could be satisfactorily rationalized. (C) 2004 Elsevier Ltd. All rights reserved.
机译:提出了一种新的状态密度模型,称为高斯状态密度,用于定量了解FeSi Kondo绝缘系统的电导率行为。电子相关和无序的影响,负责该系统的物理属性,明智地纳入此模型。在该模型的框架内,Awadhesh Mani等人报道了FeSi1-xGex(x = 0.0:0.05和0.20)与温度和压力有关的电导率数据的详细定量分析。 [物理Rev.B 63(2001)115103]已经进行。通过这些分析,可以令人满意地合理化这些样品中实验观察到的复杂的能隙压力依赖性。 (C)2004 Elsevier Ltd.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号