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首页> 外文期刊>IEEE Journal of Solid-State Circuits >A 1.8-V embedded 18-Mb DRAM macro with a 9-ns RAS access time andmemory-cell area efficiency of 33%
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A 1.8-V embedded 18-Mb DRAM macro with a 9-ns RAS access time andmemory-cell area efficiency of 33%

机译:一个1.8V嵌入式18Mb DRAM宏,具有9ns的RAS访问时间,存储单元面积效率为33%

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摘要

A 1.8-V embedded 18-Mb DRAM macro with a 9-ns row-address-strobenaccess time and memory-cell area efficiency of 33% has been successfullyndeveloped with a single-side interface architecture, high-speed circuitndesign, and low-voltage design. In the high-speed circuit design, anmultiword redundancy scheme and Y-select merged sense scheme arendeveloped to achieve the performance goal. In the low-voltage design, andual-complement charge-pump scheme and a decoupling capacitor utilizingna tantalum-oxide capacitor are developed to retain high performance atnlow supply voltage
机译:具有单侧接口架构,高速电路设计和低电压的成功开发出了具有9ns行地址-存取时间访问时间和33%的存储单元面积效率的1.8V嵌入式18-Mb DRAM宏。设计。在高速电路设计中,未开发多字冗余方案和Y选择合并感知方案以实现性能目标。在低电压设计中,开发了互补式电荷泵方案和利用钽氧化物电容器的去耦电容器,以在低电源电压下保持高性能

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