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Fast Low Power eDRAM Hierarchical Differential Sense Amplifier

机译:快速低功耗eDRAM分层差分感测放大器

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摘要

In this paper, a hierarchical differential sense amplifier for fast, low power DRAM arrays in logic-based eDRAM technology that operates with large parameter variations is described. Unique features of the hierarchical sense amplifier include its short local bit lines and a local half sense amplifier p device latch that is connected by a switch to a global half sense amplifier n device latch. When the local and global half latches are connected by the switch, they form a conventional cross-coupled latch. As a result of the short bit lines, the magnitude of the differential signal is large enough to overcome device variations in the various pairs of like-devices of the sense amplifier. The differential sense amplifier is quite insensitive to absolute parameter variation and mainly sensitive to mismatches between paired devices. The hierarchical differential sense amplifier has very low static power due to the use of a sense voltage of approximately Vdd/2 which causes low leakage in the local and global sense amplifiers as well as in the storage cell. Low active power also results from this Vdd/2 sensing. In addition, simulation results show low latency, fast restore, and fast cycle time with clocking and timing that are relatively simple.
机译:在本文中,描述了一种基于逻辑的eDRAM技术中用于快速,低功耗DRAM阵列的分级差分读出放大器,该放大器具有较大的参数变化。分级读出放大器的独特功能包括其短的局部位线和局部半读出放大器p器件锁存器,该器件锁存器通过开关连接到全局半读出放大器n器件锁存器。当局部和全局半锁存器通过开关连接时,它们形成传统的交叉耦合锁存器。作为短位线的结果,差分信号的大小足够大,以克服读出放大器的各对相似器件中的器件变化。差分读出放大器对绝对参数变化非常不敏感,并且主要对配对设备之间的失配敏感。由于使用了大约Vdd / 2的检测电压,分级差分检测放大器具有非常低的静态功率,这会导致本地和全局检测放大器以及存储单元中的低泄漏。 Vdd / 2感应也会导致低有功功率。此外,仿真结果表明,低延迟,快速恢复和快速循环时间以及相对简单的时钟和定时。

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