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Evaluation of delay-time degradation of low-voltage BiCMOS based on a novel analytical delay-time modeling

机译:基于新型解析延迟时间模型的低压BiCMOS延迟时间退化评估

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The degradation of delay time of totem-pole BiCMOS, CBiCMOS, and BiNMOS circuits by supply voltage reduction is evaluated by a novel delay-time model. It has been found that base-collector capacitance plays a greater role in determining the delay time than other parasitic capacitances in BiCMOS circuits. It is concluded that when the input signal swings fully from zero to the supply voltage, the minimum supply voltage to guarantee high-speed operation over CMOS circuits is almost the same for the three kinds of BiCMOS circuits. When the input swing is reduced by the base-emitter voltage, however, BiNMOS and CBiCMOS circuits can operate on a lower supply voltage than totem-pole BiCMOS circuits.
机译:通过新型延迟时间模型评估了电源电压降低导致图腾柱BiCMOS,CBiCMOS和BiNMOS电路延迟时间的降低。已经发现,与BiCMOS电路中的其他寄生电容相比,基极-集电极电容在确定延迟时间中起着更大的作用。结论是,当输入信号完全从零摆动到电源电压时,对于三种BiCMOS电路,保证在CMOS电路上高速工作的最小电源电压几乎相同。但是,当输入摆幅通过基极-发射极电压减小时,BiNMOS和CBiCMOS电路可以在比图腾柱BiCMOS电路更低的电源电压下工作。

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