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AlGaN-Based Linear Array for UV Solar-Blind Imaging From 240 to 280 nm

机译:基于AlGaN的线性阵列,适用于240至280 nm的UV太阳盲成像

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摘要

The realization of a linear array of 300 pixels, with a 26-(mu)m pitch, based on Al_(x)Ga_(1-x)N metal-semiconductor-metal photodetectors, is described. The composition of the active layer is chosen in order to optimize the solar-blind operation: A sharp cutoff at 280 nm is observed, with discrimination between far and medium ultraviolet (UV) of three orders of magnitude. The detector shows a peak responsivity of 12 mA/W and a dark current smaller than 1 fA at the typical polarization of 4 V. The maximum resolution is analyzed in terms of modulation transfer function (MTF): The best result is obtained for a front-side illumination, i.e., when an MTF of 0.45 is measured at the half Nyquist frequency (19.2 lp/mm). Some UV images, which are obtained in a pushbroom model, are reported. The visible rejection is proven by directly imaging the arc of a Xenon lamp: It is shown that only the relatively weak far-UV component contributes to the signal.
机译:描述了基于Al_(x)Ga_(1-x)N金属-半导体-金属光电探测器的具有26-μm间距的300个像素的线性阵列的实现。选择活性层的成分是为了优化日光盲操作:观察到在280 nm处有一个陡峭的截止,在远紫外光和中紫外光(UV)之间的区分为三个数量级。该检测器显示出12 mA / W的峰值响应度和在4 V的典型极化下的暗电流小于1 fA。根据调制传递函数(MTF)分析了最大分辨率:对于前端,可获得最佳结果侧照明,即在半奈奎斯特频率(19.2 lp / mm)下测得的MTF为0.45时。报告了一些在推扫帚模型中获得的UV图像。通过直接对氙气灯的电弧进行成像,可以证明可见光的抑制作用:表明,只有相对较弱的远紫外线分量才对信号产生影响。

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