...
首页> 外文期刊>Sensors and Actuators >Point defects assisted NH_3 gas sensing properties in ZnO nanostructures
【24h】

Point defects assisted NH_3 gas sensing properties in ZnO nanostructures

机译:点缺陷辅助ZnO纳米结构中的NH_3气敏特性

获取原文
获取原文并翻译 | 示例

摘要

In this report, the NH_3 gas sensing properties of ZnO nanostructures fabricated by radio frequency magnetron sputtering under various argon sputtering pressures have been investigated under various temperatures. The morphological transitions occur from vertical standing nanorods to inclined and tapered nanostructures with increasing the argon sputtering pressure. The dominant green emission at around 2.28 eV in the photoluminescence spectra signifies the presence of oxygen vacancies in the ZnO nanostructures which increases as a function of argon sputtering pressure. Despite low surface area, the nanostructures grown under higher argon sputtering pressure of 10 Pa exhibit excellent NH_3 gas response magnitude since it is exhibiting more oxygen vacancies as compared to other counterparts. For 25 ppm NH_3 gas at room temperature, a response time of 49 s and a fast recovery time of 19 s are attributed to the modification in the intermediate defect states induced by the oxygen vacancies through the adsorption and desorption of gas molecules on the surface of ZnO nanostructures.
机译:在该报告中,已经研究了在各种温度下通过射频磁控溅射在各种氩溅射压力下制造的ZnO纳米结构的NH_3气敏特性。随着氩溅射压力的增加,从垂直站立的纳米棒到倾斜的和渐缩的纳米结构发生形态转变。在光致发光光谱中约2.28 eV处的主要绿色发射表示ZnO纳米结构中存在氧空位,该空位随着氩气溅射压力的增加而增加。尽管表面积很小,但在10 Pa的更高氩气溅射压力下生长的纳米结构却表现出出色的NH_3气体响应强度,因为与其他同类材料相比,它显示出更多的氧空位。对于室温下25 ppm NH_3气体,响应时间为49 s,快速恢复时间为19 s,这归因于氧空位通过吸附和解吸表面上气体分子而引起的中间缺陷状态的改变。 ZnO纳米结构。

著录项

  • 来源
    《Sensors and Actuators 》 |2015年第6期| 10-17| 共8页
  • 作者单位

    Centre for Nanoscience and Nanotechnology, School of Physics, Bharathidasan University, Tiruchirappalli 620 024, Tamilnadu, India,Department of Physics, Sri S. Ramasamy Naidu Memorial College, Sattur 626 203, Tamilnadu, India;

    Centre for Nanoscience and Nanotechnology, School of Physics, Bharathidasan University, Tiruchirappalli 620 024, Tamilnadu, India;

    Centre for Nanoscience and Nanotechnology, School of Physics, Bharathidasan University, Tiruchirappalli 620 024, Tamilnadu, India,Department of Electronic Materials Engineering, The Australian National University, Canberra, ACT 0200, Australia;

    Indian Institute of Science Education and Research (IISER), Trivandrum, India;

    Centre for Nanoscience and Nanotechnology, School of Physics, Bharathidasan University, Tiruchirappalli 620 024, Tamilnadu, India;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    ZnO nanostructures; Sputtering; Raman scattering; Point defects; NH_3 gas sensor;

    机译:ZnO纳米结构;溅射;拉曼散射点缺陷;NH_3气体传感器;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号