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Global luminescence lifetime imaging of thermally activated delayed fluorescence on an auto-phase-locked time-gated microscope

机译:在自动锁相时间门控显微镜上热激活延迟荧光的全局发光寿命成像

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Luminescence lifetime imaging plays an important role in time-resolved detection of luminescence decay differences in microscopic scale. However, the traditional instruments always require expensive detector such as time-correlated single photon counter, stream camera, or intensified CCDs, limiting their practical applications. Herein, a novel approach for global lifetime imaging was developed based on an auto-phase-locked time-gated luminescence microscopy. By utilizing a common color CCD to photograph a set of time-gated luminescence images at different phase differences between the exciting and detecting, a luminescence lifetime image could be obtained by exponential fitting of the gray level of each pixel to the delay time. Compare to the lifetime imaging based on point-by-point scanning, this is a global lifetime measurement of all the pixels, which consumes much less time in detecting long-lifetimes over microseconds. Besides, this method needs no expensive confocal laser scanning systems, intensified CCDs or complex electronic phase matching control, which greatly simplifies the instrument and decreases the cost. This approach was successfully used for fast luminescence lifetime imaging of two classical TADF molecules, which exhibited obvious lifetime differences in microscopic scale. The temporal resolution of the system could reach a few microseconds, suggesting its extensive applicability for many other molecules with long lifetimes.
机译:发光寿命成像在时间分辨的微观尺度上的发光衰减差异检测中起着重要作用。但是,传统仪器始终需要昂贵的检测器,例如与时间相关的单光子计数器,流式摄像机或增强型CCD,这限制了它们的实际应用。在此,基于自动锁相时间门控发光显微镜技术,开发了一种用于全球寿命成像的新方法。通过使用普通彩色CCD在激发和检测之间的不同相位差处拍摄一组时间门控发光图像,可以通过将每个像素的灰度级与延迟时间进行指数拟合来获得发光寿命图像。与基于逐点扫描的寿命成像相比,这是对所有像素的全局寿命测量,在检测微秒以上的长寿命方面所花费的时间要少得多。此外,该方法不需要昂贵的共聚焦激光扫描系统,增强的CCD或复杂的电子相位匹配控制,从而大大简化了仪器并降低了成本。此方法已成功用于两个经典TADF分子的快速发光寿命成像,这些寿命在微观尺度上表现出明显的寿命差异。该系统的时间分辨率可能达到几微秒,这表明它对许多其他寿命长的分子具有广泛的适用性。

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