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On a GaAs-based transistor-type hydrogen sensing detector with a Pd/Al_(0.24)Ga_(0.76)As metal-semiconductor Schottky gate

机译:在具有Pd / Al_(0.24)Ga_(0.76)As金属半导体肖特基栅极的基于GaAs的晶体管型氢感测探测器上

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An interesting transistor-type hydrogen sensing detector based on a GaAs pseudomorphic high electron mobility transistor (PHEMT) with a Pd/Al_(0.24)Ga_(0.76)As metal-semiconductor Schottky gate structure is fabricated and investigated. Steady-state properties and transient responses under different temperatures and hydrogen concentrations are measured and studied. Significant modulations in electrical signals are observed, obviously due to the adsorption of hydrogen atoms at the Pd-semiconductor interface. Also, the studied device exhibits fast response and recovery properties. The corresponding adsorption and desorption time constants (τ_a and τ_b) are 2.5 and 6 s, respectively, under 9970 ppm H_2/air gas at 160℃. Furthermore, based on the Langmuir isotherm and the van't Hoff equation, a hydrogen adsorption heat of —37.02 kJ mole~(-1) is obtained at lower operating temperatures ( ≤ 72℃). However, at a high temperature region ( ≥ 92℃), the ΔH~0 value is increased to -68.62 kJ mole~(-1). The hydrogen adsorption heat at lower and higher temperature regimes is demonstrated and studied. Consequentially, based on the experimental results, the studied device is promising for GaAs integrated circuit (IC) and micro electric and mechanic system (MEMS) applications.
机译:制造并研究了一种有趣的晶体管型氢感测探测器,该探测器基于具有Pd / Al_(0.24)Ga_(0.76)As金属半导体肖特基栅极结构的GaAs伪形高电子迁移率晶体管(PHEMT)。测量和研究了在不同温度和氢气浓度下的稳态特性和瞬态响应。观察到电信号的显着调制,显然是由于氢原子在Pd-半导体界面上的吸附。而且,所研究的设备表现出快速的响应和恢复特性。在160℃的9970 ppm H_2 /空气下,相应的吸附和解吸时间常数(τ_a和τ_b)分别为2.5和6 s。此外,基于Langmuir等温线和van't Hoff方程,在较低的工作温度(≤72℃)下可获得-37.02 kJ mole〜(-1)的氢吸附热。然而,在高温区域(≥92℃),ΔH〜0值增加到-68.62 kJ mole〜(-1)。对氢在较低和较高温度下的吸附热进行了研究。因此,基于实验结果,所研究的器件有望用于GaAs集成电路(IC)和微电子及机械系统(MEMS)应用。

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