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Performance modeling of MWIR InAs/GaSb/B-Al_(0.2)Ga_(0.8)Sb type-Ⅱ superlattice nBn detector

机译:MWIR InAs / GaSb / B-Al_(0.2)Ga_(0.8)SbⅡ型超晶格nBn检测器的性能建模

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This paper reports on the unipolar medium wavelength infrared (MWIR) InAs/GaSb/B-Al_(0.2)Ga_(0.8)Sb type-II superlattice (T2SL) nBn detector's photoelectrical performance. In our model, the heterojunction barrier-active region (absorber) was assumed to be decisive as the contributing dark current mechanism limiting nBn's detector performance. The voltage drop analysis on the nBn structure was introduced to estimate the bias drop on the heterojunction barrier-active region. It was assumed that the contact n~+-barrier heterojunction's layer has an insignificant influence on the electrical properties of the detector. In addition, a bulk-based model with an effective band gap of T2SL material has been assumed in the device modeling. Both current-voltage (I-V) and differential resistance-area product RA(V,T), characteristics of nBn's detector were found to be dominated by diffusion and generation-recombination currents in the zero-bias and the low-bias regions. At medium values of reverse voltages, the dark current was mostly affected by trap-assisted tunneling, whereas the band-to-band tunneling revealed its contribution at high values of reverse bias (V > 0.7 V). The RA(V,T) characteristics' fitting procedure allowed estimation of both diffusion and generation-recombination lifetimes as well as the trap energy level temperature dependence within T2SL energy gap. It was predicted that at T = 77 K, the RA product and detectivity reached values of 1000 flcm~2 and 4 × 10~(11) cm Hz~(1/2) W~(-1), respectively. The corresponding values at room temperature were 0.01 Ωcm~2 and D* = 5 × 10~8 cmHz~(1/2) W~(-1), respectively. Finally, InAs/GaSb/B-Al_(0.2)Ga_(0.8)Sb T2SLs nBn's state of the art was compared to the performance of InAs/GaSb T2SLs PIN photodiodes and the HgCdTe bulk photodiodes operated at near-room temperature. It was shown that the RA product of the MWIR T2SLs nBn detector has reached a comparable level with the state of the art of the HgCdTe bulk photodiodes.
机译:本文报道了单极中波长红外(MWIR)InAs / GaSb / B-Al_(0.2)Ga_(0.8)Sb II型超晶格(T2SL)nBn检测器的光电性能。在我们的模型中,异质结势垒有源区(吸收体)被认为是决定性的,因为它是限制nBn探测器性能的暗电流机制。引入了对nBn结构的电压降分析,以估计异质结势垒有源区的偏压降。假设接触n〜+势垒异质结层对检测器的电性能影响不大。另外,在器件建模中已假定具有基于T2SL材料的有效带隙的基于本体的模型。发现nBn检波器的电流-电压(I-V)和差分电阻面积积RA(V,T)均受零偏区和低偏区中的扩散和复合电流的影响。在中等反向电压值时,暗电流主要受陷阱辅助隧穿的影响,而带间隧穿揭示了其在较高反向偏压值(V> 0.7 V)下的贡献。 RA(V,T)特性的拟合过程允许估计扩散寿命和生成重组寿命,以及T2SL能隙内的陷阱能级温度依赖性。可以预料,在T = 77 K时,RA产物和检测率分别达到1000 flcm〜2和4×10〜(11)cm Hz〜(1/2)W〜(-1)。室温下的相应值分别为0.01Ωcm〜2和D * = 5×10〜8 cmHz〜(1/2)W〜(-1)。最后,将InAs / GaSb / B-Al_(0.2)Ga_(0.8)Sb T2SLs nBn的最新技术与InAs / GaSb T2SLs PIN光电二极管和HgCdTe体光电二极管在近室温下的性能进行了比较。结果表明,MWIR T2SLs nBn检测器的RA产物已达到与HgCdTe体光电二极管技术水平相当的水平。

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  • 来源
    《Semiconductor science and technology》 |2012年第5期|p.055002.1-055002.10|共10页
  • 作者单位

    Institute of Applied Physics, Military University of Technology, 2 Kaliskiego St, 00-908 Warsaw,Poland;

    Institute of Applied Physics, Military University of Technology, 2 Kaliskiego St, 00-908 Warsaw,Poland;

    Department of Electrical and Computer Engineering, Center for High Technology Materials,University of New Mexico, Albuquerque, NM 87106, USA;

    Institute of Applied Physics, Military University of Technology, 2 Kaliskiego St, 00-908 Warsaw,Poland;

    Institute of Applied Physics, Military University of Technology, 2 Kaliskiego St, 00-908 Warsaw,Poland;

    Institute of Applied Physics, Military University of Technology, 2 Kaliskiego St, 00-908 Warsaw,Poland;

    Department of Electrical and Computer Engineering, Center for High Technology Materials,University of New Mexico, Albuquerque, NM 87106, USA;

    Institute of Applied Physics, Military University of Technology, 2 Kaliskiego St, 00-908 Warsaw,Poland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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  • 入库时间 2022-08-18 01:31:06

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