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CdS-based p-i-n diodes using indium and copper doped CdS films by pulsed laser deposition

机译:基于CdS的p-i-n二极管,采用铟和铜掺杂的CdS膜,通过脉冲激光沉积

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In this work we report a method to dope cadmium sulfide (CdS) thin films using pulsed laser deposition. Doping is achieved during film growth at substrate temperatures of 100 degrees C by sequential deposition of the CdS and the dopant material. Indium sulfide and copper disulfide targets were used as the dopant sources for n-type and p-type doping, respectively. Film resistivities as low as 0.2 and 1 Omega cm were achieved for indium and copper doped films, respectively. Hall effect measurements demonstrated the change in conductivity type from ntype to p-type when the copper dopants are incorporated into the film. The controlled incorporation of indium or copper, in the undoped CdS film, results in substitutional defects in the CdS, which increases the electron and hole concentration up to 4 x 10(18) cm(-3) and 3 x 10(20) cm(-3), respectively. The results observed with CdS doping can be expanded to other chalcogenides material compounds by just selecting different targets. With the optimized doped films, CdS-based p-i-n diodes were fabricated yielding an ideality factor of 4, a saturation current density of 2 x 10(-6) A cm(-2) and a rectification ratio of three orders of magnitude at +/- 3 V.
机译:在这项工作中,我们报告了一种使用脉冲激光沉积来掺杂硫化镉(CdS)薄膜的方法。通过顺序沉积CdS和掺杂材料,可以在衬底温度为100摄氏度的膜生长过程中实现掺杂。硫化铟和二硫化铜靶分别用作n型和p型掺杂的掺杂源。掺杂铟和铜的薄膜的电阻率分别低至0.2和1Ωcm。霍尔效应测量表明,将铜掺杂剂掺入膜中后,导电类型从n型变为p型。在未掺杂的CdS膜中铟或铜的受控掺入会导致CdS中的替代缺陷,从而使电子和空穴浓度增加到4 x 10(18)cm(-3)和3 x 10(20)cm (-3)。只需选择不同的靶标,CdS掺杂观察到的结果可以扩展到其他硫族化物材料化合物。通过优化的掺杂膜,制造了基于CdS的Pin二极管,其理想因子为4,饱和电流密度为2 x 10(-6)A cm(-2),在+ /时的整流比为三个数量级。 -3 V

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