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The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

机译:研究新兴的微纳机械系统(M和NEM)中的辐射效应

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摘要

The potential of micro and nano electromechanical systems (M and NEMS) has expanded due to advances in materials and fabrication processes. A wide variety of materials are now being pursued and deployed for M and NEMS including silicon carbide (SiC), III-V materials, thinfilm piezoelectric and ferroelectric, electro-optical and 2D atomic crystals such as graphene, hexagonal boron nitride (h-BN), and molybdenum disulfide (MoS2). The miniaturization, functionality and low-power operation offered by these types of devices are attractive for many application areas including physical sciences, medical, space and military uses, where exposure to radiation is a reliability consideration. Understanding the impact of radiation on these materials and devices is necessary for applications in radiation environments.
机译:由于材料和制造工艺的进步,微和纳米机电系统(M和NEMS)的潜力得到了扩展。目前正在为M和NEMS寻求和部署多种材料,包括碳化硅(SiC),III-V材料,薄膜压电和铁电,光电和二维原子晶体,例如石墨烯,六方氮化硼(h-BN) )和二硫化钼(MoS2)。这些类型的设备所提供的小型化,功能性和低功耗操作对于许多应用领域具有吸引力,包括物理科学,医学,太空和军事用途,在这些领域中,暴露于辐射是可靠性的考量。对于辐射环境中的应用,必须了解辐射对这些材料和设备的影响。

著录项

  • 来源
    《Semiconductor science and technology》 |2017年第1期|013005.1-013005.14|共14页
  • 作者单位

    Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA;

    Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA;

    Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA;

    Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA;

    Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA;

    Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA;

    Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA;

    Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA;

    Vanderbilt Univ, Dept Phys, Nashville, TN 37235 USA;

    Vanderbilt Univ, Dept Phys, Nashville, TN 37235 USA;

    Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA;

    Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA;

    MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA;

    MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA;

    Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA;

    Univ Louisville, Dept Elect & Comp Engn, Louisville, KY 40292 USA;

    Univ Louisville, Dept Elect & Comp Engn, Louisville, KY 40292 USA;

    Univ Louisville, Dept Elect & Comp Engn, Louisville, KY 40292 USA;

    Univ Louisville, Dept Elect & Comp Engn, Louisville, KY 40292 USA;

    Univ Louisville, Dept Elect & Comp Engn, Louisville, KY 40292 USA;

    Case Western Reserve Univ, Dept Elect & Comp Engn, Cleveland, OH 44106 USA;

    CEA Leti, MINATEC Campus, 17 Rue Martyrs, F-38054 Grenoble 9, France;

    CEA Leti, MINATEC Campus, 17 Rue Martyrs, F-38054 Grenoble 9, France;

    Sandia Natl Labs, Albuquerque, NM 87123 USA;

    Army Res Lab, Adelphi, MD 20783 USA;

    Army Res Lab, Adelphi, MD 20783 USA;

    North Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA;

    Naval Res Lab, Elect Sci & Technol Div, Washington, DC 20375 USA;

    Naval Res Lab, Elect Sci & Technol Div, Washington, DC 20375 USA;

    Georgia Inst Technol, GWoodruff Sch Mech Engn, Atlanta, GA 30332 USA|Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    MEMS; NEMS; radiation effects; silicon carbide (SiC); 2D materials; micromachined cantilevers;

    机译:MEMS;NEMS;辐射效应;碳化硅(SiC);2D材料;微加工悬臂梁;
  • 入库时间 2022-08-18 01:29:36

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