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Analytical model for dc drain current-voltage relationship in double-diffused channel of DMOS transistor

机译:DMOS晶体管双扩散沟道直流漏电流-电压关系的解析模型

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摘要

An analytical model for the dc current-voltage relationship in a double-diffused channel with a lateral nonuniform doping profile of a DMOS transistor has been developed. The equations are similar forms to the current-voltage equations of a conventional MOS transistor. The velocity saturation effect and the mobility reduction effect caused by a perpendicular electric field are also included. The model was verified by comparison with the results of two-dimensional numerical simulation and the fabricated device with a good agreement. The proposed model in this paper can be very useful for designing and analysing power devices with a double-diffused channel structure.
机译:已经建立了具有DMOS晶体管的横向非均匀掺杂分布的双扩散沟道中的直流电流-电压关系的解析模型。该方程式与常规MOS晶体管的电流-电压方程式相似。还包括由垂直电场引起的速度饱和效应和迁移率降低效应。通过与二维数值模拟的结果进行比较,验证了模型的正确性。本文提出的模型对于设计和分析具有双扩散通道结构的功率器件非常有用。

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