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Transport Phenomena in Porous Low-k Dielentrics

机译:多孔低介电常数的输运现象

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To achieve materials with dielectric constants ≤2.5 while meeting all the properties required for dual-damascene integration at interconnect feature sizes of ≤100 nm, it is necessary to introduce controlled porosity into the material. At present, there is controversy involving the nature of the pores generated in the matrix of the materials: Should the pores be closed or open? Does it matter? What pore size is acceptable? Can process gases or water permeate porous materials?
机译:为了获得介电常数≤2.5的材料,同时满足互连特征尺寸≤100nm的双大马士革集成所需的所有性能,必须在材料中引入受控的孔隙率。目前,在材料基质中产生的孔的性质存在争议:孔是封闭的还是开放的?有关系吗?什么孔径可以接受?处理气体或水能否渗透到多孔材料中?

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