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Got Tin Whiskers?

机译:有锡须?

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摘要

The potential for "tin whisker" growths on component lead plating, solder and solder paste skyrocketed along with the industry's lead-free transition little more than a year ago. What might surprise you, though, is that tin whiskers aren't wreaking as much havoc as initially expected — yet.rnWhat are tin whiskers? NASA has been studying tin whiskers for many years and defines them as electrically conductive crystalline structures of tin that can grow from surfaces where tin (often electroplated tin) is used as a final finish. Tin whiskers are typically shown as having the shape of a very thin, single filament or hair-like protrusion that emerges outward (Z axis) from the surface (Figure). And they can cause electronic system failures by bridging closely spaced circuit elements maintained at different electrical potentials. Most frustrating, the exact causes, conditions and time frames involving tin whisker formation remain unknown.
机译:一年多以前,随着组件的无铅过渡,组件铅镀层,焊锡和焊膏上“锡晶须”的增长猛增。但是,可能使您感到惊讶的是锡晶须并未像最初预期的那样遭受严重的破坏-锡晶须是什么?美国国家航空航天局(NASA)多年来一直在研究锡晶须,并将其定义为锡的导电晶体结构,该结构可以从使用锡(通常为电镀锡)作为最终表面的表面上生长出来。锡晶须通常显示为非常细的单丝或头发状突起的形状,该突起从表面向外(Z轴)露出(图)。它们会通过桥接保持在不同电位的紧密间隔的电路元件而导致电子系统故障。最令人沮丧的是,涉及锡晶须形成的确切原因,条件和时间表仍然未知。

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