Dependence of the Dielectric Constant on the Structure of Extruded Polyvinylidene Fluoride Films

摘要

The structure of extruded polyvinylidene fluoride films obtained at different die drawing ratios and melt temperatures was studied by X-ray scattering, differential scanning calorimetry, and gravimetry. Their dielectric constant and mechanical properties were examined. The influence exerted by the structure of the amorphous phase and by the molecular weight of the polymer on the dielectric constant of the samples was revealed.