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New ambient pressure photoemission endstation at Advanced Light Source beamline 9.3.2

机译:先进光源光束线9.3.2上的新环境压力光发射终端站

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摘要

During the past decade, the application of ambient pressure photoemission spectroscopy (APPES) has been recognized as an important in situ tool to study environmental and materials science, energy related science, and many other fields. Several APPES endstations are currently under planning or development at the USA and international light sources, which will lead to a rapid expansion of this technique. The present work describes the design and performance of a new APPES instrument at the Advanced Light Source beamline 9.3.2 at Lawrence Berkeley National Laboratory. This new instrument, Scienta R4000 HiPP, is a result of collaboration between Advanced Light Source and its industrial partner VG-Scienta. The R4000 HiPP provides superior electron transmission as well as spectromicroscopy modes with 16 μm spatial resolution in one dimension and angle-resolved modes with simulated 0.5° angular resolution at 24° acceptance. Under maximum transmission mode, the electron detection efficiency is more than an order of magnitude better than the previous endstation at beamline 9.3.2. Herein we describe the design and performance of the system, which has been utilized to record spectra above 2 mbar. © 2010 American Institute of Physics Article Outline INTRODUCTION SYSTEM DESIGN APPES system considerations General design Prelens design SYSTEM PERFORMANCE Differential pumping Improved transmission Spatial resolution Angular resolution CONCLUSIONS
机译:在过去的十年中,环境压力光发射光谱法(APPES)的应用已被认为是研究环境和材料科学,能源相关科学以及许多其他领域的重要现场工具。美国和国际光源目前正在计划或开发多个APPES终端站,这将导致该技术的快速扩展。本工作描述了劳伦斯伯克利国家实验室的高级光源光束线9.3.2上新APPES仪器的设计和性能。这款新仪器Scienta R4000 HiPP是Advanced Light Source与工业伙伴VG-Scienta合作的结果。 R4000 HiPP提供出色的电子传输以及一维具有16μm空间分辨率的光谱显微镜模式,以及在24°接受度下具有模拟0.5°角分辨率的角度分辨模式。在最大传输模式下,电子检测效率比束线9.3.2处的上一个终端站高出一个数量级。在这里,我们描述了系统的设计和性能,该系统已被用来记录2 mbar以上的光谱。 ©2010美国物理研究所文章概述简介系统设计APPES系统注意事项常规设计Prelens设计系统性能差动泵浦改善的传输率空间分辨率角分辨率结论

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  • 来源
    《Review of Scientific Instruments》 |2010年第5期|p.1-7|共7页
  • 作者单位

    Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94709, USA|Department of Applied Physics, Hanyang University-ERICA, Gyeonggi-do 426-791, South Korea;

    VG Scienta, Uppssala SE-752 28, Sweden;

    Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94709, USA|Department of Physics, Çukurova University, Adana 01330, Turkey;

    VG Scienta, Uppssala SE-752 28, Sweden;

    VG Scienta, Uppssala SE-752 28, Sweden|BW Particle Optics AB, SE-822 22, Alfta, Sweden;

    Department of Applied Physics, Hanyang University-ERICA, Gyeonggi-do 426-791, South Korea;

    Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94709, USA;

    Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94709, USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    photoelectron spectroscopy;

    机译:光电子能谱;

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