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Study of Structural and Optical Properties of Undoped and Cd Doped SnO_2 Thin Films Prepared by Sol-Gel Dip Coating Technique

机译:溶胶-凝胶浸涂技术制备未掺杂和掺镉的SnO_2薄膜的结构和光学性质的研究

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摘要

In this study, we report the study of the surface morphology, the structural and optical proprieties of transparent cadmium doped tin dioxide (Cd:SnO_2) thin films deposited on glass and Si(100) substrates by Sol Gel Dip Coating (SGDC) technique. The analysis was carried out using Grazing Incidence X-Ray Diffraction (GIXRD), Atomic Force Microscopy (AFM), UV-Vis spectrophotometry and Spectroscopic Ellipsometry (SE). The X-ray diffraction reveals that all films deposited on Si(100) substrate have tetragonal crystalline structure with preferential orientation along (310) plane, but an amorphous structure is obtained for all the films prepared on glass substrate. The surface roughness, observed by means of AFM varies from 19 to 4 nm. The optical measurements show that the deposited Cd;SnO_2 films have a high transparency (~86%) in the visible spectrum and a band gap energy decreasing from 3.60 eV to 3.31 eV with increasing Cd concentration. The obtained values of the refractive index of the films are ranging between 1.559 and 1.613.
机译:在这项研究中,我们报告了通过溶胶凝胶浸涂(SGDC)技术沉积在玻璃和Si(100)衬底上的透明镉掺杂二氧化锡(Cd:SnO_2)薄膜的表面形态,结构和光学特性的研究。使用掠入射X射线衍射(GIXRD),原子力显微镜(AFM),UV-Vis分光光度法和光谱椭圆仪(SE)进行分析。 X射线衍射表明,沉积在Si(100)衬底上的所有膜均具有四方晶结构,并沿(310)平面优先取向,但是在玻璃衬底上制备的所有膜均获得了非晶结构。借助于AFM观察到的表面粗糙度在19至4nm之间变化。光学测量表明,沉积的Cd; SnO_2薄膜在可见光谱中具有较高的透明度(〜86%),并且随着Cd浓度的增加,带隙能量从3.60 eV降低至3.31 eV。所获得的膜的折射率值在1.559和1.613之间。

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    Department of Physics, University Freres Mentouri Constantine, Thin Films and Interfaces Laboratory, Route Ain El Bey, Constantine 25000,Department of Materials Sciences, Faculty of Nature and Life Sciences, University Larbi Tebessi Tebessa, Constantine Road, Tebessa 12002, Algeria;

    Department of Physics, University Freres Mentouri Constantine, Thin Films and Interfaces Laboratory, Route Ain El Bey, Constantine 25000;

    Department of Materials Sciences, Applied and Theoretical Physics Laboratory, University Larbi Tebessi Tebessa, Constantine Road, Tebessa 12002, Algeria;

    Department of Physics, University Freres Mentouri Constantine, Thin Films and Interfaces Laboratory, Route Ain El Bey, Constantine 25000;

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  • 正文语种 eng
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  • 关键词

    AFM; Cd: SnO_2 thin films; SE; Sol-gel; TCO; XRD; UV-vis;

    机译:原子力显微镜Cd:SnO_2薄膜;SE;溶胶凝胶TCO;XRD;紫外线可见;

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