Galvanomagnetic properties of Pb_1-xSn_xTe polycrystalline pressed samples

摘要

Pressed samples of Pb_1-xSn_xTe, with x=0.0, 0.1, 0.2, 0.3 and 0.4 were prepared. Elemental analysis shoed the presence of excess tellurium in these samples. X-ray diffraction analysis confirmed the polycrystalline structure. The calculated unit cell dimension, (a in A), decreases with the tin substitution in lead telluride. Electrical resistivity, ρ, decreased from 1.3 to 6.3×10~-4 Ω cm at room temperature, when "x" increased. From the hot probe test all the samples were of p-type conduction at room temperature (300 K).