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INVESTIGATION OF 3D ORAM MATERIALS FOR RADIATION DOSIMETRY

机译:辐射剂量学的3D ORAM材料研究

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摘要

Three-dimensional optical random access memories (3D ORAM) are bistable photochromic materials that can be converted from the stable non-fluorescent form to the quasi-stable fluorescent form via two-photon absorption using intersecting laser beams. To investigate heavy charged particle (HCP) radiation effects on these materials, thin films of spyrobenzopyran- doped polymethylmethacrylate (SP/PMMA) were exposed to 0.6-2.5 MeV protons, 2 MeV and 5 MeV alpha particles, and 6.5 MeV ~(12)C ions at fluences ranging from 10~(10) to 10~(14) cm~(-2). Exposed films were optically sectioned with a confocal laser scanning microscope (CLSM) and radiation effects were evaluated by measuring fluorescent intensity verses depth. Radiation exposure of the non-fluorescent form of SP/PMMA resulted in a permanent change, leaving fluorescent tracks excitable by optical wave- lengths. Depth profiles revealed a correlation between maximum fluorescent intensity and absorbed dose. Additionally, the full width at half maximum (FWHM) of the depth profiles could be related to the incident HCP energy per nucleon.
机译:三维光学随机存取存储器(3D ORAM)是双稳态光致变色材料,可以使用相交的激光束通过双光子吸收将其从稳定的非荧光形式转换为准稳定的荧光形式。为了研究重电荷粒子(HCP)辐射对这些材料的影响,将掺有吡咯并吡喃的聚甲基丙烯酸甲酯(SP / PMMA)薄膜暴露于0.6-2.5 MeV质子,2 MeV和5 MeVα粒子以及6.5 MeV〜(12)离子浓度范围为10〜(10)至10〜(14)cm〜(-2)。用共聚焦激光扫描显微镜(CLSM)对曝光的胶片进行光学切片,并通过测量荧光强度与深度来评估辐射效果。 SP / PMMA的非荧光形式的辐射暴露导致永久性变化,使荧光轨道可被光波长激发。深度图显示最大荧光强度与吸收剂量之间的相关性。另外,深度分布的半峰全宽(FWHM)可能与每个核子的入射HCP能量有关。

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