OPTIMISATION ON THE TWO-LAYER STACK GAMMA DETECTORS OF CSI(TL) COUPLED WITH A PIN PHOTODIODE FOR NON-DESTRUCTIVE TESTING

摘要

This paper proposed the two-layer stack scintillator-coupled photodiode detector to improve the measurement accuracy of the gamma-ray scanning. Both MCNPX and DETECT97 code were used to design the detector. The two manufactured two-layer stack gamma detectors were used to measure the density profile of the distillation column of the radiographic non-intrusive process diagnostic area. To compare the measurement accuracy of the density profile through the non-destructive transmission test, the relative error of the four fluids used for the process diagnostics was analysed. To summarise the measurement results with regard to the relative error of the Nal(Tl) detector and the manufactured detector by material as well as the total relative error, the total relative error of the Nal(TI) detector was about 15.7 %, whereas that of the two-layer stack CsI(Tl) with photodiode detectors were about 5 %. This paper confirmed that the measurement accuracy of the detector proposed was improved by about three times as compared with the Nal(Tl) detector mostly used for non-destructive testing.