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Bimodal failure behaviour of metal film resistors

机译:金属膜电阻器的双峰失效行为

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摘要

The ageing behaviour of metal film resistors was studied using high-resolution in-situ resistance measurements. A temperature storage experiment was performed at five different temperature levels. At each condition, the Ageing behaviour of 128 resistors was monitored. It turned out that the failure behaviour of the samples is Rather complicated. One remarkable fact is that measurements coming form two different production lots led To completely different results.
机译:使用高分辨率的原位电阻测量研究了金属膜电阻器的老化行为。在五个不同的温度水平下进行了温度存储实验。在每种情况下,均监视128个电阻的老化行为。事实证明,样品的失效行为相当复杂。一个显着的事实是,来自两个不同生产批次的测量结果导致了完全不同的结果。

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