A fraction defective based capability index

摘要

Two problems greatly affect the use of capability indices such as C_p, C_pkm: the lack of affinity with the process fraction defective π and the difficulty of dealing with the sampling distributions of their natural estimators. In this paper, a capability index which is in one-to-one correspondence with π is introduced and simple inferential procedures under a Bayesian perspective are developed to facilitate its use in industrial applications.