A Note on 'Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index C_(pk)'

摘要

The generalized yield index C_(pk)~T establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index C_(PU)~T was considered, and the asymptotic distribution of the natural estimator C_(PU)~T was developed. Then, we derived the lower confidence bounds as well as the critical values of index C_(PU)~T. We not only provided some tables but also presented an application example.