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Comparison among several commonly used sampling methods for a degradation test

机译:比较几种常用的降解测试采样方法

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摘要

Degradation testing is an effective tool for evaluating the reliability of highly reliable products. There have been many data collection methods proposed in the literature. Some of these assumed that only degradation values are recorded, and some assumed failure times to be available. However, most research has been devoted to proposing parameter estimates or to designing degradation tests for a specific sampling method. The differences between these commonly used methods have rarely been investigated. The lack of comparisons between different sampling methods has made it difficult to select an appropriate means by which to collect data. In addition, it remains unclear whether obtaining extra information (eg, exact failure times) is useful for making statistical inferences. In this paper, we assume that the degradation path of a product follows a Wiener degradation process, and we summarize several data collection methods. Maximum likelihood estimates for parameters and their variance-covariance matrices are derived for each type of data. Several commonly used optimization criteria for designing a degradation test are used to compare estimation efficiency. Sufficient conditions under which one method could be better than the others are proposed. Upper bounds of estimation efficiency are also investigated. Our results provide useful guidelines by which to choose a sampling method, as well as its design variables, to obtain efficient estimation. A simulated example based on real light-emitting diodes data is studied to verify our theoretical results under a moderate sample size scenario.
机译:降级测试是评估高度可靠产品可靠性的有效工具。文献中提出了许多数据收集方法。其中一些假设仅记录降级值,而某些假设的故障时间可用。但是,大多数研究都致力于提出参数估计或针对特定采样方法设计退化测试。这些常用方法之间的差异很少被研究。由于不同采样方法之间缺乏比较,因此很难选择合适的数据收集手段。另外,尚不清楚获得额外的信息(例如准确的故障时间)是否可用于进行统计推断。在本文中,我们假设产品的降解路径遵循Wiener降解过程,并且我们总结了几种数据收集方法。针对每种数据类型,得出参数及其方差-协方差矩阵的最大似然估计。设计降解测试的几种常用优化标准用于比较估计效率。提出了一种方法可能优于另一种方法的充分条件。还研究了估计效率的上限。我们的结果提供了有用的指南,通过这些指南可以选择抽样方法及其设计变量,以获得有效的估算。研究了基于实际发光二极管数据的模拟示例,以验证我们在中等样本量情况下的理论结果。

著录项

  • 来源
  • 作者

    Hu Cheng-Hung; Lee Ming-Yung;

  • 作者单位

    Natl Cheng Kung Univ, Dept Ind & Informat Management, Tainan, Taiwan;

    Providence Univ, Dept Stat & Informat Sci, 200,Sec 7,Taiwan Blvd, Taichung 43301, Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 13:09:35

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