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Friction traced to the single atom

机译:摩擦可追溯到单个原子

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Friction is caused by dissipative lateral forces that act between macroscopic objects. An improved understanding of friction is therefore expected from measurements of dissipative lateral forces acting between individual atoms. Here we establish atomic resolution of both conservative and dissipative forces by lateral force microscopy, presenting the resolution of atomic defects. The interaction between a single-tip atom that is oscillated parallel to an Si(111)-(7 x 7) surface is measured. A dissipation energy of up to 4 eV per oscillation cycle is found. The dissipation is explained by a "plucking action of one atom on to the other" as described by G. A. Tomlinson in 1929 [Tomlinson, G. A. (1929) Phil. Mag. 7, 905-939].
机译:摩擦是由作用在宏观物体之间的耗散侧向力引起的。因此,期望通过测量作用在各个原子之间的耗散侧向力来更好地理解摩擦。在这里,我们通过侧向力显微镜建立了保守力和耗散力的原子分辨率,提出了原子缺陷的分辨率。测量平行于Si(111)-(7 x 7)表面振荡的单尖端原子之间的相互作用。发现每个振荡周期的耗散能量高达4 eV。消散通过“一个原子对另一个原子的拔动作用”来解释,如G. A. Tomlinson在1929年所描述的[Tomlinson,G. A.(1929)Phil。魔术师7,905-939]。

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