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首页> 外文期刊>Proceedings of the IEE - Part B: Radio and Electronic Engineering >Power measurement at 4 Gc/s by the application of the Hall effect in a semiconductor
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Power measurement at 4 Gc/s by the application of the Hall effect in a semiconductor

机译:通过在半导体中应用霍尔效应以4 Gc / s的功率测量

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When a semiconducting crystal is mounted in the path of an electromagnetic wave, a Hall e.m.f. is set up in the material along the direction of propagation with a value proportional to the power transmitted. The device operates most satisfactorily when the wave impedance is small, so that for a given power the electric-field component is reduced to a minimum. The use of a resonant cavity with the crystal erected in it at a point of strong magnetic field enables such favourable conditions to be established, and this arrangement forms the basis of the wattmeter described. The instrument is capable of measuring power at 4 Gc/s with an error of ???????±3% from 30 mW to about 20 watts, and with the unique feature that this performance can be achieved at any standing-wave ratio between unity and 0.1 while absorbing only about 3.4% of the power measured. Some experiments on semiconductors mounted directly in a waveguide are also described, showing the possibility in this case of using several crystals in cascade.
机译:当将半导体晶体安装在电磁波路径中时,霍尔e.m.f.沿传播方向在材料中设定的“α”值与传输的功率成比例。当波阻抗较小时,该设备的运行效果最令人满意,因此对于给定的功率,电场分量会降至最低。使用在强磁场点上竖立有晶体的谐振腔可以建立这种有利条件,并且这种布置构成了所描述的功率计的基础。该仪器能够以4 Gc / s的功率测量功率,从30 mW到大约20瓦特的误差为±3%,并且具有可以在任何驻波下实现的性能的独特功能。单位和0.1之比,而仅吸收约3.4%的测量功率。还描述了一些直接安装在波导中的半导体的实验,显示了在这种情况下级联使用多个晶体的可能性。

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