...
首页> 外文期刊>Printed Circuit Design & Manufacture >Tin Whisker Management Guidelines, Part 2
【24h】

Tin Whisker Management Guidelines, Part 2

机译:锡晶须管理指南,第2部分

获取原文
获取原文并翻译 | 示例

摘要

Sample size. To ensure a consistent plating process, testing should be done on three different plating finish lots, with different date codes and plated at least one week apart, or plated on different plating lines. The final sample sizes recommended were a tradeoff to accommodate user needs without being an excessive burden to suppliers. TABLE 3 (online) shows iNEMI recommendations for number of samples and sample preparation. The proposed JESD 201 modifies the sample sizes slightly. Preconditioning. Preconditioning samples prior to test condition exposure helps simulate actual use conditions. Three different preconditions are recommended. The two reflow conditions (described below) require an initial four weeks at ambient.
机译:样本量。为了确保一致的镀覆过程,应在三个不同的镀覆完成批次上进行测试,每个镀层具有不同的日期代码,并且至少间隔一周进行镀覆,或者在不同的镀覆线上进行镀覆。建议的最终样本量是折衷方案,可以满足用户需求,而又不会给供应商带来过多负担。表3(在线)显示了iNEMI关于样品数量和样品制备的建议。建议的JESD 201会稍微修改样本大小。预处理。在暴露测试条件之前对样品进行预处理可帮助模拟实际使用条件。建议使用三个不同的前提条件。两种回流条件(如下所述)需要在室温下最初的四个星期。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号