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KEY ICT GUIDELINES

机译:关键ICT指南

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Don't tie IC control lines directly to power or ground. Add pull-up or pull-down resistors.This permits the ICT to control these lines when required during IC testing. 1.Place test points away from BGA components to reduce BGA solder stress and board flex.2.Have a test point for all electrical nodes, including unused IC pins. This allows detection of internal and external shorts.3.To measure a low ohm resistor, two test points on each side of the component may be required to support 4-wire Kelvin resistance measuring.4.Oscillator should be gated with logic circuit, allowing ICT to disable the clock signal as needed during IC testing.5.Use boundary-scan-compliant devices when possible. This provides accessibility to the devices for boards with limited access test points. Also, chain multiple JTAG devices.
机译:不要将IC控制线直接连接到电源或接地。添加上拉或下拉电阻器,这允许ICT在IC测试期间根据需要控制这些线路。 1.将测试点放置在远离BGA组件的位置,以减少BGA焊接应力和电路板弯曲。2.为所有电气节点(包括未使用的IC引脚)建立一个测试点。这样可以检测内部和外部短路3.要测量低欧姆电阻器,可能需要在组件的每一侧上两个测试点来支持4线开尔文电阻测量.4。振荡器应通过逻辑电路进行门控,以允许ICT可在IC测试期间根据需要禁用时钟信号。5。尽可能使用兼容边界扫描的设备。这为具有有限访问测试点的电路板提供了设备的可访问性。另外,链接多个JTAG设备。

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