Compton profile of tantalum

摘要

The Compton profile of tantalum (Ta) has been measured using IGP type coaxial photon detector. The target atoms were excited by means of 59.54 keV γ-rays from Am-241. The measurements were carried out on a high purity thin elemental foil. The data were recoreded in a 4 K multichannel analyzer. These data duly corrected for various effects are presented and compared with theoretical and measured values. Best agreement with experiment is found for the 5d~36s~2 electron configuration.