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首页> 外文期刊>Power Electronics, IET >Way of operation to improve performance for advanced split-gate resurf stepped oxide UMOSFET
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Way of operation to improve performance for advanced split-gate resurf stepped oxide UMOSFET

机译:改进先进的分栅再冲浪阶梯式氧化物UMOSFET性能的操作方法

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In this study, a way of operating a double split-gate resurf stepped oxide (DSGRSO) UMOS has been proposed. The n-drift region is divided into two parts by the double split-gate: the upper one and the lower one, which enhances the resurf active effect and binges in an electric field peak in the middle of the n-drift region, and decreases the width of split-gate trench, resulting in an increase of figure of merit (FOM). The simulation results show that the DSGRSO UMOS has improved the saturated breakdown voltage by 25.7% and FOM by 108% as compared with SGRSO UMOS at the certain aspect ratio.
机译:在这项研究中,提出了一种操作双分裂栅再冲浪阶梯式氧化物(DSGRSO)UMOS的方法。 n漂移区被双分裂栅分为两部分:上部分和下部分,这增强了resurf主动效应和n漂移区中间的电场峰值的冲击,并减小了分裂栅沟槽的宽度,导致品质因数(FOM)的增加。仿真结果表明,在一定长宽比下,与SGRSO UMOS相比,DSGRSO UMOS的饱和击穿电压提高了25.7%,FOM提高了108%。

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