Validation of Voltage Sag Simulation Tools: ATP and Short-Circuit Calculation Versus Field Measurements

摘要

Two methods to calculate voltage sags are validated against actual measurements. One of the methods is a short-circuit calculation program resulting directly in sag magnitude during the fault. The other is an electromagnetic transient program resulting in voltage waveform as a function of time. Individual sag characteristics and system performance obtained by deterministic simulation and measurement are compared. The influence of the random variables (prefault voltage, fault location and fault impedance) is investigated.