2014 Denver X-ray Conference Workshops

摘要

Two-dimensional diffraction data contains abundant information about the atomic arrangement, microstructure, and defects of a solid or liquid material. In recent years, the use of two-dimensional detectors has dramatically increased in academic, government and industrial laboratories. This workshop covers recent progress in two-dimensional X-ray diffraction in terms of detector technology, geometry and configuration of the two-dimensional diffractometer. Various applications such as phase ID, texture, stress, crystallinity, combinational screening and thin film analysis will be discussed.