Characterization of polyester degradation using tapping mode atomic force microscopy: exposure to alkaline solution at room temperature

摘要

Tapping mode atomic force microscopy(AFM)was used to examine the microstructure of polyester films before and after exposure to an alkaline solution. Phase imaging and force curves showed differences in properties between the degraded and undegraded regions. Additionally, chemical analyses of the degraded films and the immersion solutions were carried out using attenuated total reflection Fourier transform infrared spectroscopy, total carbon analysis and liquid chromatography-mass spec- trometry to aid in the interpretation of AFM data.