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Valley pumping via edge states and the nonlocal valley Hall effect in two-dimensional semiconductors

机译:山谷通过边缘状态泵送和非本体谷霍尔效应二维半导体

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摘要

Recent experiments have studied the temperature and gale voltage dependence of nonlocal transport in bilayer graphene. identifying features thought to be associated with the two-dimensional semiconductor's bulk intrinsic valley Hall effect. Here, we use both simple microscopic tight-binding ribbon models and phenomenological bulk transport equations to emphasize the impact of sample edges on the nonlocal voltage signals. We show that the nonlocal valley Hall response is sensitive to electronic structure details at the sample edges and that it is enhanced when the local longitudinal conductivity is larger near the sample edges than in the bulk. We discuss recent experiments in light of these lindings and also discuss the close analogy between electron pumping between valleys near two-dimensional sample edges in the valley Hall effect and bulk pumping between valleys due to the chiral anomaly in three-dimensional topological semimelals.
机译:最近的实验已经研究了双层石墨烯中非识别量输送的温度和大孔电压依赖性。识别与二维半导体散装内在谷霍尔效应相关的特征。这里,我们使用简单的微观紧密结合带模型和现象学散装传输方程来强调样品边缘对非函数电压信号的影响。我们表明,非局部谷霍尔响应对样品边缘的电子结构细节很敏感,并且当局部纵向导电率较大时比样品边缘更大,而不是在块状中增加。我们鉴于这些润装,讨论最近的实验,并且还讨论了谷霍尔效应中的二维样品边缘附近的山谷泵之间的电子泵浦的紧密比目,并且由于三维拓扑半脉线的手性异常,山谷之间的散装泵送。

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  • 来源
    《Physical review》 |2020年第15期|155205.1-155205.12|共12页
  • 作者单位

    RIKEN Center for Emergent Mailer Science Wako Saitama 351-0198 Japan;

    Department of Physics The University of Texas at Austin Austin Texas 78712 USA;

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