...
首页> 外文期刊>Physical review >Light irradiation induced brittle-to-ductile and ductile-to-brittle transition in inorganic semiconductors
【24h】

Light irradiation induced brittle-to-ductile and ductile-to-brittle transition in inorganic semiconductors

机译:光辐照诱导无机半导体中的脆性-延性和延性-脆性转变

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

The intrinsic brittleness of inorganic semiconductors prevents them from extended engineering applications under extreme conditions of high temperature and pressure, making it essential to improve their ductility. Here, we applied the constrained density functional theory to examine the relationship between plastic deformation and photonic excitation in sphalerite ZnS and related II-IV semiconductors. We find that ZnS transforms from a dislocation dominated deformation mode in the ground state to a twin dominated deformation mode with bandgap electronic excitations, leading to brittle failure under light illumination. This agrees very well with recent mechanical experiments on single crystal ZnS. More interesting, we predict that the ZnTe and CdTe display the opposite mechanical behavior compared to ZnS, exhibiting ductility close to metallic level with bandgap illumination, but typical brittle failure in the dark state. Our results provide a general approach to design more shapeable and tougher semiconductor devices by controlling exposure to electronic excitation.
机译:无机半导体的固有脆性使其无法在高温和高压的极端条件下进行扩展的工程应用,因此必须提高其延展性。在这里,我们应用约束密度泛函理论研究了闪锌矿ZnS及其相关II-IV半导体中塑性变形与光子激发之间的关系。我们发现,ZnS从基态的位错占主导地位的变形模式转变为带隙电子激发的孪生占主导地位的变形模式,导致光照射下的脆性破坏。这与最近在单晶ZnS上进行的机械实验非常吻合。更有趣的是,我们预测与ZnS相比,ZnTe和CdTe表现出相反的机械性能,在带隙照明下具有接近金属水平的延展性,但在黑暗状态下通常会发生脆性破坏。我们的结果提供了一种通过控制暴露于电子激励来设计更可塑,更坚韧的半导体器件的通用方法。

著录项

  • 来源
    《Physical review》 |2019年第16期|161202.1-161202.6|共6页
  • 作者单位

    Univ Nevada, Dept Chem & Mat Engn, Reno, NV 89557 USA;

    South Ural State Univ, Dept Comp Simulat & Nanotechnol, Chelyabinsk 454080, Russia;

    CALTECH, Mat & Proc Simulat Ctr, Pasadena, CA 91125 USA;

    Univ Nevada, Dept Chem & Mat Engn, Reno, NV 89557 USA;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号