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首页> 外文期刊>Physical review. B, Condensed Matter And Materials Physics >X-ray reflectivity studies of atomic-level surface-segregation in a liquid eutectic alloy of AuSn
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X-ray reflectivity studies of atomic-level surface-segregation in a liquid eutectic alloy of AuSn

机译:AuSn液态低共熔合金中原子级表面偏析的X射线反射率研究

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X-ray reflectivity studies reveal atomic-level surface-segregation at the free surface of the eutectic Au_(71)Sn_(29) liquid alloy. The surface-segregation extends up to three layers, in which the top layer is almost a pure monolayer of Sn, the second layer is almost a pure monolayer of Au and the third layer appears to be slightly enhanced in Au. Although the surface-segregation concentration profiles can be qualitatively accounted for by the theories of Defay-Prigogine and Strohl-King, they cannot satisfactorily account for the measured surface tension.
机译:X射线反射率研究表明,共晶Au_(71)Sn_(29)液态合金的自由表面存在原子级表面偏析。表面偏析扩展到三层,其中顶层几乎是纯Sn单层,第二层几乎是纯Au单层,第三层的Au似乎略有增强。尽管可以通过Defay-Prigogine和Strohl-King的理论定性地解释表面偏析浓度分布,但它们不能令人满意地解释所测得的表面张力。

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