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机译:纳米级Pt / Al / SiO_2界面上有效功函数的横向变化的纳米级分辨率测量和建模
Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA;
Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Ulsan, Korea;
Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA;
microscopy of surfaces, interfaces, and thin films; metal-insulator-semiconductor structures (including semiconductor-to-insulator); surface states, band structure, electron density of states;
机译:从头开始研究SiO_2上的Al-Ni双层膜:对栅堆叠中有效功函数调制的影响
机译:硅化镍/ SiO_2界面处杂质偏析引起有效功函数调制的物理机制
机译:突然的4H-SiC(0001)/ SiO_2界面模型的结构和电子性质:经典分子动力学模拟和密度泛函计算
机译:脑测量可用性测试和自适应接口:揭示句法工作负载的示例,其具有近红外光谱的功能
机译:用于膜蛋白分析和分子贩运测量的液滴界面双层技术。
机译:精氨酸渗透到模型DMPC脂质双层中的自由能:有效抗衡离子浓度和横向双层尺寸的耦合
机译:纳米级Pt / Al / SiO2界面上有效功函数的横向变化的纳米级分辨率测量和建模