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Charge excitations in stripe-ordered La_5/3Sr_1/3NiO_4 and La_15/_8Ba_1/8CuO_4: Interpretation of the anomalous momentum transfer dependence via fluorescence interferometry

机译:条纹有序La_5 / 3Sr_1 / 3NiO_4和La_15 / _8Ba_1 / 8CuO_4中的电荷激发:通过荧光干涉法解释异常动量传递依赖性

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摘要

Fluorescence interferometry (FI) makes use of the temporal and spatial coherence of absorption and re-emission process in resonant inelastic x-ray scattering (RIXS), which leads to interference terms in the RIXS cross section of a group of identical, physically equivalent, and interacting atoms. These interferences contain structural information and make RIXS site selective. The basics of FI are derived within the third-order perturbation treatment of indirect RIXS. The final relations for the FI related RIXS cross section were used to interpret the unique momentum-transfer dependence of the in-gap charge excitations observed for 214-type nickelates (La_5/3Sr_1/3NiO_4) and cuprates (La_15/8Ba_1/gCuO_4). By using well-known stripe models, the momentum-transfer dependence of the corresponding indirect RIXS features is traced back to interference terms in the RIXS cross section based on the principles of FI. Thus analyzing the momentum-transfer dependence of the re-emitted radiation yields information about details of the charge stripe structure.
机译:荧光干涉法(FI)在共振非弹性X射线散射(RIXS)中利用了吸收和再发射过程的时间和空间相干性,从而在一组相同的,物理上等效的,和相互作用的原子。这些干扰包含结构信息,并使RIXS站点具有选择性。 FI的基本原理来自间接RIXS的三阶扰动处理。与FI相关的RIXS横截面的最终关系用于解释针对214型镍酸盐(La_5 / 3Sr_1 / 3NiO_4)和铜酸盐(La_15 / 8Ba_1 / gCuO_4)观察到的带内电荷激发的独特动量传递依赖性。通过使用众所周知的条纹模型,基于FI原理,相应的间接RIXS特征的动量传递相关性可以追溯到RIXS横截面中的干扰项。因此,分析再发射的辐射的动量传递依赖性会产生有关电荷条带结构细节的信息。

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