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Band structure and Fermi surface of URu_2Si_2 studied by soft x-ray angle-resolved photoemission spectroscopy

机译:软X射线角分辨光发射光谱法研究URu_2Si_2的能带结构和费米面

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We have performed angle-resolved photoelectron spectroscopy experiments in the soft x-ray region in order to clarify the band structure and Fermi surfaces (FSs) of URu_2Si_2. In the vicinity of the Fermi level, U 5f-derived quasiparticle bands were clearly observed. They form a small and a large hole FS centered at the Z point and a large electron FS centered at the Γ point. The overall band structure as well as the FSs are explained by a band structure calculation treating all U 5/ electrons as being itinerant. The observed FSs have nesting vectors which give a possible explanation for the spin fluctuations observed by inelastic neutron scattering measurements.
机译:为了阐明URu_2Si_2的能带结构和费米表面(FSs),我们在软X射线区域进行了角分辨光电子能谱实验。在费米能级附近,清楚地观察到了U 5f衍生的准粒子带。它们形成了一个以Z点为中心的大和小空穴FS和一个以Γ点为中心的大电子FS。通过将所有U 5 /电子视为迭代子的能带结构计算来解释整个能带结构以及FS。观测到的FS具有嵌套向量,这些向量为非弹性中子散射测量所观测到的自旋波动提供了可能的解释。

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