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Quantum Hall effect in graphene with twisted bilayer stripe defects

机译:具有扭曲的双层条纹缺陷的石墨烯中的量子霍尔效应

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We analyze the quantum Hall effect in single layer graphene with bilayer stripe defects. Such defects are often encountered at steps in the substrate of graphene grown on silicon carbide. We show that AB or AA stacked bilayer stripes result in large Hall conductivity fluctuations that destroy the quantum Hall plateaux. The fluctuations are a result of the coupling of edge states at opposite edges through currents traversing the stripe. Upon rotation of the second layer with respect to the continuous monolayer (a twisted-bilayer stripe defect), such currents decouple from the extended edge states and develop into long-lived discrete quasibound states circulating around the perimeter of the stripe. Backscattering of edge modes then occurs only at precise resonant energies, and hence the quantum Hall plateaux are recovered as twist angle grows.
机译:我们分析了具有双层条纹缺陷的单层石墨烯中的量子霍尔效应。在生长在碳化硅上的石墨烯的基底中的步骤通常会遇到这种缺陷。我们表明,AB或AA堆叠的双层条纹会导致大的霍尔电导率波动,从而破坏量子霍尔平台。波动是由于穿过条带的电流在相对边缘处的边缘状态耦合而导致的。当第二层相对于连续单层旋转时(扭曲的双层条纹缺陷),这种电流与延伸的边缘状态解耦,并发展成围绕条纹的周长循环的长寿命离散准结合状态。边模的后向散射仅在精确的共振能量处发生,因此随着扭曲角的增大,量子霍尔平台恢复。

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