机译:高分辨率透射电子显微镜观察到的金在扭曲晶界处的支座位错
Department of Materials Science and Engineering and Center for Iron & Steel Research, RIAM, Seoul National University, Seoul 151-744,Republic of Korea;
Department of Materials Science and Engineering and Center for Iron & Steel Research, RIAM, Seoul National University, Seoul 151-744,Republic of Korea;
Korea Basic Science Institute, Daejeon 305-806, Republic of Korea;
Korea Basic Science Institute, Daejeon 305-806, Republic of Korea;
Department of Materials Science and Engineering and Center for Iron & Steel Research, RIAM, Seoul National University, Seoul 151-744,Republic of Korea;
Department of Materials Science and Engineering and Center for Iron & Steel Research, RIAM, Seoul National University, Seoul 151-744,Republic of Korea;
direct observation of dislocations and other defects (etch pits; decoration; electron microscopy; x-ray topography; etc.); grain and twin boundaries;
机译:原位高分辨率透射电子显微镜调查纳米晶体CRMNFeconi高熵合金中的晶界脱位活动
机译:铜中Σ= 3 {111}晶界附近的易碎晶界位错弛豫的原位透射电镜研究
机译:具有等效晶界面的Al_2O_3 [0001]对称倾斜晶界的原子结构的高分辨率透射电子显微镜和原子分析
机译:金薄膜中Σ= 3晶界之间位错发射结的原位透射电镜研究
机译:沿高角度晶粒边界(位移,机械冶金,电子显微镜)的滑移传播。
机译:透射电子显微镜观察Al晶粒尺寸晶界沟槽与Al / AlOx / Al隧道结氧化物势垒厚度局部变化的相关性
机译:原位透射电子显微镜研究σ= 3粒薄膜晶界之间的交界处的位错发射研究
机译:用透射电子显微镜表征外部晶界位错和晶界位错源。最终报告,1979年6月1日至1981年5月31日