...
首页> 外文期刊>Physical review >Influence of excitonic oscillator strengths on the optical properties of GaN and ZnO
【24h】

Influence of excitonic oscillator strengths on the optical properties of GaN and ZnO

机译:激子振荡器强度对GaN和ZnO光学性能的影响

获取原文
获取原文并翻译 | 示例

摘要

We report on an extensive study of the excitonic properties of GaN and ZnO bulk samples with an accurate determination of excitonic parameters by linear and nonlinear spectroscopics. The in-depth comparative study is carried out between these two competitive wide band gap semiconductors for a better understanding of damping processes. In GaN, it is shown that due to microscopic disorder, such as lattice strain fluctuations, inhomogeneous broadening prevails over homogeneous broadening at low temperature. The opposite situation occurs in ZnO, where the homogeneous broadening dominates due to resonant Rayleigh scattering of exciton polaritons and their interaction with acoustic phonons. This comparative study also allows us to highlight the influence of oscillator strengths on spectrally resolved four-wave mixing and time-integrated four-wave mixing.
机译:我们报告了对GaN和ZnO块状样品的激子性质的广泛研究,并通过线性和非线性光谱学准确确定了激子参数。在这两种竞争性宽带隙半导体之间进行了深入的比较研究,以更好地了解阻尼过程。在GaN中,显示出由于微观失调,例如晶格应变波动,在低温下不均匀的展宽优于均匀的展宽。相反的情况发生在ZnO中,由于激子极化子的共振瑞利散射及其与声子的相互作用,ZnO的均匀展宽占主导地位。这项比较研究还使我们能够强调振荡器强度对频谱分辨四波混频和时间积分四波混频的影响。

著录项

  • 来源
    《Physical review 》 |2014年第4期| 045204.1-045204.9| 共9页
  • 作者单位

    Clermont Universite, Institut Pascal (IP), BP 10448, F-63000 Clermont-Ferrand, France,Centre National de la Recherche Scientifique, Unite Mixte de Recherche 6602, IP, F-63171 Aubiere, France;

    Clermont Universite, Institut Pascal (IP), BP 10448, F-63000 Clermont-Ferrand, France,Centre National de la Recherche Scientifique, Unite Mixte de Recherche 6602, IP, F-63171 Aubiere, France;

    Clermont Universite, Institut Pascal (IP), BP 10448, F-63000 Clermont-Ferrand, France,Centre National de la Recherche Scientifique, Unite Mixte de Recherche 6602, IP, F-63171 Aubiere, France;

    Ioffe Physical-Technical Institute, St. Petersburg 194021, Russia;

    Clermont Universite, Institut Pascal (IP), BP 10448, F-63000 Clermont-Ferrand, France,Centre National de la Recherche Scientifique, Unite Mixte de Recherche 6602, IP, F-63171 Aubiere, France;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    optical properties of bulk materials and thin films; Ⅲ-Ⅴ semiconductors; Ⅱ-Ⅵ semiconductors;

    机译:散装材料和薄膜的光学性能;Ⅲ-Ⅴ族半导体;Ⅱ-Ⅵ半导体;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号