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Positron annihilation spectroscopy investigation of vacancy defects in neutron-irradiated 3C-SiC

机译:正电子an没光谱研究中子辐照3C-SiC中的空位缺陷

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摘要

104103.1-104103.11%Positron annihilation spectroscopy characterization results for neutron-irradiated 3C-SİC are described here, with a specific focus on explaining the size and character of vacancy clusters as a complement to the current understanding of the neutron irradiation response of 3C-SİC. Positron annihilation lifetime spectroscopy was used to capture the irradiation temperature and dose dependence of vacancy defects in 3C-SİC following neutron irradiation from 0.01 to 31 dpa in the temperature range from 380 °C to 790 °C. The neutral and negatively charged vacancy clusters were identified and quantified. The results suggest that the vacancy defects that were measured by positron annihilation spectroscopy technique contribute very little to the transient swelling of SiC. In addition, coincidence Doppler broadening measurement was used to investigate the chemical identity surrounding the positron trapping sites. It was found that silicon vacancy-related defects dominate in the studied materials and the production of the antisite defect C_(si) may result in an increase in the probability of positron annihilation with silicon core electrons.
机译:104103.1-104103.11这里描述了中子辐照3C-SİC的正电子an没光谱表征结果,特别着重于解释空位团簇的大小和特征,作为对当前对3C-SİC中子辐照响应的理解的补充。正电子an没寿命光谱用于捕获中子辐照在380°C至790°C的温度下0.01至31 dpa后3C-SİC中空位缺陷的辐照温度和剂量依赖性。鉴定并定量了中性和带负电荷的空位簇。结果表明,通过正电子an没光谱技术测量的空位缺陷对SiC的瞬时溶胀贡献很小。此外,巧合多普勒加宽测量被用来研究正电子俘获位点周围的化学特性。已经发现,与硅空位有关的缺陷在所研究的材料中占主导地位,并且反位缺陷C_(si)的产生可能导致硅核电子被正电子an没的可能性增加。

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  • 来源
    《Physical Review. B, Condensed Matter》 |2017年第10期|104103.1-104103.11|共11页
  • 作者单位

    Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA;

    Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA;

    Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA;

    Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA,University of Tennessee, Knoxville, Tennessee 37996, USA;

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