Comment on 'Three-Dimensional, Spin-Resolved Structure of Magnetic Vortex and Antivortex States in Patterned Co Films Using Scanning Ion Microscopy with Polarization Analysis'

摘要

In a recent Letter, Li and Rau presented a new method, scanning ion microscopy with polarization analysis (SIMPA), where a focused beam of Ga~+ ions (25 keV) is scanned across the surface and a spin analysis of the emitted electrons allows an imaging of all magnetization components. As any experimental method, SIMPA may be subject to artifacts, such as the existence of wide tails or an increased effective probe width due to convolution with the sample damage function, all possibly giving rise to inaccurate results. The data of Ref.